JOINT IAPR INTERNATIONAL WORKSHOPS ON
 Structural and Syntactic Pattern Recognition (SSPR 2006)
 and
 Statistical Techniques in Pattern Recognition (SPR 2006)
 
 August 17-19, 2006
 Hong Kong University of Science and Technology, China
 
 Web site:  http://www.ssspr.org/2006/
 Paper submission deadline:  January 31, 2006
 
 The International Association for Pattern Recognition (IAPR) and its
 Technical Committees on Statistical Pattern Recognition (TC1) and
 Structural and Syntactical Pattern Recognition (TC2) will organize the
 next joint workshops at the Hong Kong University of Science and
 Technology (HKUST) prior to ICPR 2006 which will also be held in Hong
 Kong.  The joint workshops aim at promoting interaction and
 collaboration not only among researchers working directly in areas
 covered by TC1 and TC2 but also among those in other fields who use
 statistical, structural or syntactical techniques extensively.  We
 welcome mathematicians, statisticians, researchers in machine learning
 and practitioners alike who, at present, work outside the pattern
 recognition community. 
 
 SSPR Topics:
   Structural matching; Syntactic pattern recognition; Image
   understanding; Shape analysis; Graphical models; Graph-based
   methods; Spectral methods for graph-based representations;
   Probabilistic and stochastic structural models for PR;
   Structural learning in spatial or spatio-temporal signals;
   Kernel methods for structured data; Image and video analysis;
   Intelligent sensing systems; Spatio-temporal pattern recognition;
   SSPR methods in computer vision; Multimedia signal analysis;
   Image document analysis; Structured text analysis and
   understanding; Novel applications
 
 SPR Topics:
   Density estimation; Large margin classifiers; Kernel methods;
   Ensemble methods and multiple classifiers; Bayesian methods;
   Gaussian processes; Dimensionality reduction; Independent
   component analysis; Cluster analysis and unsupervised learning;
   Data visualization; Semi-supervised learning; Model selection;
   Hybrid methods; Comparative studies; Speech and image analysis;
   Novel applications
 
 The workshops will comprise of invited talks, oral and poster
 presentations, and panel discussions.  In addition, the SSPR workshop
 will have a special session called Graph Based Methods in Structural
 Pattern Recognition co-organized by the Technical Committee on Graph
 Based Representations (TC15).  Accepted papers will appear in the
 proceedings which will be published by Springer in the Lecture Notes
 in Computer Science series (http://www.springeronline.com/lncs), and
 will be distributed to all participants during the workshops.