Call for Papers and Announcement

Wavelet Applications in Industrial Processing V (SA109)
Part of SPIE’s International Symposium on Optics East 2007
9-12 September 2007 • Seaport World Trade Center • Boston, MA, USA

Abstract Due Date: 26 February 2007
Manuscript Due Date: 13 August 2007

Web site
http://spie.org/Conferences/Calls/07/oe/submitAbstract/index.cfm?fuseaction=SA109

Conference Chairs: Frédéric Truchetet, Univ. de Bourgogne (France);
Olivier Laligant, Univ. de Bourgogne (France)

Program Committee: Patrice Abry, École Normale Supérieure de Lyon
(France); Radu V. Balan, Siemens Corporate Research; Atilla M. Baskurt,
Univ. Claude Bernard Lyon 1 (France); Amel Benazza-Benyahia, Ecole
Supérieure des Communications de Tunis (Tunisia); Albert Bijaoui,
Observatoire de la Côte d'Azur (France); Seiji Hata, Kagawa Univ.
(Japan); Henk J. A. M. Heijmans, Ctr. for Mathematics and Computer
Science (Netherlands); William S. Hortos, Associates in Communication
Engineering Research and Technology; Jacques Lewalle, Syracuse Univ.;
Wilfried R. Philips, Univ. Gent (Belgium); Alexandra Pizurica, Univ.
Gent (Belgium); Guoping Qiu, The Univ. of Nottingham (United Kingdom);
Hamed Sari-Sarraf, Texas Tech Univ.; Peter Schelkens, Vrije Univ.
Brussel (Belgium); Paul Scheunders, Univ. Antwerpen (Belgium); Kenneth
W. Tobin, Jr., Oak Ridge National Lab.; Günther K. G. Wernicke,
Humboldt-Univ. zu Berlin (Germany); Gerald Zauner, Fachhochschule Wels
(Austria).

The wavelet transform, multiresolution analysis, and other space-
frequency or space-scale approaches are now considered standard tools by
researchers in image and signal processing. Promising practical results
in machine vision and sensors for industrial applications and non
destructive testing have been obtained, and a lot of ideas can be
applied to industrial imaging projects. This conference is intended to
bring together practitioners, researchers, and technologists in machine
vision, sensors, non destructive testing, signal and image processing to
share recent developments in wavelet and multiresolution approaches.
Papers emphasizing fundamental methods that are widely applicable to
industrial inspection and other industrial applications are especially
welcome.

Papers are solicited but not limited to the following areas:
o New trends in wavelet and multiresolution approach, frame and
overcomplete representations, Gabor transform, space-scale and space-
frequency analysis, multiwavelets, directional wavelets, lifting
scheme for:
- sensors
- signal and image denoising, enhancement, segmentation, image
deblurring
- texture analysis
- pattern recognition
- shape recognition
- 3D surface analysis, characterization, compression
- acoustical signal processing
- stochastic signal analysis
- seismic data analysis
- real-time implementation
- image compression
- hardware, wavelet chips.

o Applications:
- machine vision
- aspect inspection
- character recognition
- speech enhancement
- robot vision
- image databases
- image indexing or retrieval
- data hiding
- image watermarking
- non destructive evaluation
- metrology
- real-time inspection.

o Applications in microelectronics manufacturing, web and paper
products, glass, plastic, steel, inspection, power production,
chemical process, food and agriculture, pharmaceuticals, petroleum
industry.

All submissions will be peer reviewed. Please note that abstracts
must be at least 500 words in length in order to receive full
consideration.