--------------------------------------------------------------------------------- Second Call for Papers: COMPUTER VISION AND IMAGE UNDERSTANDING JOURNAL SPECIAL ISSUE ON NEW ADVANCES IN 3-D IMAGING AND MODELING http://www.3dimconference.org/cviu-na3d/ Submission due: April 30, 2008 SCOPE: 3-D imaging and modeling is the process of optically capturing and numerically representing the shape and appearance of objects and scenes. Research areas range from the design of new sensors to the construction of high quality photorealistic models. While some issues have received significant attention and matured into stable solutions, new problems and goals are emerging as the focus of the 3D research community. Such trends include the development of new approaches for the efficient recovery of accurate and complete surface geometry but also, for the combined estimation of object appearance for producing visual simulation. The recent 6th 3-D Digital Imaging and Modeling Conference held in August 2007 offered a forum to explore many related problems. This special issue of CVIU is OPEN TO ALL NEW SUBMISSIONS. They must be full journal length versions, prepared in accordance with the CVIU Guidelines. All submissions will undergo the complete CVIU peer review process. Papers previously accepted or published in a conference should contain sufficient new and extended material to warrant publication in the journal. As this is a special issue, relevance to the themes of the call for papers will be an important criterion for acceptance. EDITORIAL CALENDAR: Submission due: April 30, 2008 Results of first round: August 31, 2008 Revised paper due: November 30, 2008 Decision: January 31, 2009 Final paper due: February 28, 2009 Publication date: Spring 2009 GUEST EDITORS: Guy Godin, NRC Canada Patrick Hébert, Laval University Takeshi Masuda, AIST Japan Gabriel Taubin, Brown University Full details on the scope of the special issue and on the submission procedure can be found at: http://www.3dimconference.org/cviu-na3d/ You may also contact the guest editors for additional information.