12th International Workshop on Combinatorial Image Analysis (IWCIA'08)
Buffalo, NY, USA, April 7-9, 2008

IWCIA’08 is the twelfth of a series of international meetings on
combinatorial image analysis. It will be held in Buffalo, NY, USA,
April 7-9, 2008.  Previous meetings were held in Paris (France) 1991,
Ube (Japan) 1992, Washington DC (USA) 1994, Lyon (France) 1995,
Hiroshima (Japan) 1997, Madras (India) 1999, Caen (France, 2000),
Philadelphia (USA, 2001), Palermo (Italy, 2003), Auckland (New
Zealand, 2004) and Berlin (Germany, 2006).

Scope

Image analysis is a scientific discipline providing theoretical
foundations and methods for solving problems appearing in a wide range
of areas, as diverse as medicine, robotics, defense, and security. As
a rule, the processed data are discrete; therefore, the "discrete
approach" to image analysis appears to be a natural one and has an
increasing importance. It is based on studying combinatorial
properties of the considered digital data sets. Combinatorial image
analysis often features various advantages (in terms of efficiency and
accuracy) over the more traditional approaches based on continuous
models requiring numeric computation.

Topics

The Workshop will be a forum for current research on topics such as the following:

- Combinatorial problems in the discrete plane and space related to image analysis; lattice polygons and polytopes 
- Discrete/combinatorial geometry and topology and their use in image analysis 
- Digital geometry of curves and surfaces 
- Tilings and patterns; combinatorial pattern matching 
- Image representation, segmentation, grouping, and reconstruction 
- Methods for image compression 
- Discrete tomography 
- Applications of integer programming, linear programming, and computational geometry to problems of image analysis 
- Parallel architectures and algorithms for image analysis 
- Fuzzy and stochastic image analysis 
- Grammars and models for image or scene analysis and recognition; cellular automata 
- Mathematical morphology and its applications to image analysis 
- Applications in medical imaging, biometrics, and others 

Scientific Program

The scientific program of the workshop will consist of keynote
addresses, contributed papers presented in a single track, and
posters. We are planning to publish the workshop proceedings in the
Springer’s "Lecture Notes on Computer Science" series.  Prospective
authors are invited to submit a paper on some of the above or closely
related topics. The submitted work should contain only results that
are unpublished and not included in other work considered for
publication elsewhere. In order to be accepted, a submitted paper will
have to reach very high standards by satisfying serious evaluation
criteria. Each paper will be thoroughly reviewed by three
referees. Double-blind review process ensures maximal objectiveness.

Special Track on Applications

In addition to the theoretical research papers, a special track on
applications will take place as a part of IWCIA’08. Authors are
invited to submit original papers describing in detail working
computer systems for image analysis. Industry representatives will be
welcome to these presentations. The accepted papers will be published
in proceedings separately from the theoretical papers.

Social Program

During the workshop there will be a tour to the famous Niagara
Falls. If there is enough interest, there may be a pre- or
post-workshop tours to Genesee Country Village: the largest New York
living history museum; Erie Canal linking Lake Erie to the Hudson
River: an engineering marvel called the Eighth Wonder of the World;
Corning Museum of Glass containing more than 45,000 objects spanning
35 centuries where you have the possibility to make your own
glasswork; or Letchworth State Park, called the Grand Canyon of the
East.

Important Dates 

Full paper submission due 	October 10, 2007 
Notification of acceptance 	November 10, 2007 
Final camera-ready papers 	December 5, 2007 
Author’s registration 	December 5, 2007 
Workshop dates 	April 7-9, 2008

For more information see IWCIA'08 website Buffalo, NY, USA, April 7-9, 2008
http://www.cs.fredonia.edu/iwcia08